Texas Instruments SLUU477 User Manual download pdf (Page 4)

Test Summary

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2 Test Summary

2.1 Definitions

This procedure details how to configure the HPA678 evaluation board. On the test procedure, the

following naming conventions are followed.

VXXX : External voltage supply name (VBUS, VBAT)

LOADW: External load name (LOADR, LOADI)

V(TPyyy): Voltage at internal test point (TPyyy). For example, V(TP1) means the voltage at TP1.

V(Jxx): Voltage at jack terminal (Jxx).

V(XXX): Voltage at (XXX). For example, V(VDPM) means the voltage at the test point which is

marked "VDPM".

V(XXX, YYY): Voltage across point XXX and YYY.

I(JXX(YYY)): Current going out from the YYY terminal of jack XX.

Jxx(BBB): Terminal or pin BBB of jack xx

Jxx ON : Internal jumper Jxx terminals are shorted

Jxx OFF: Internal jumper Jxx terminals are open

Jxx (-YY-) ON: Internal jumper Jxx adjacent terminals marked as "YY" are shorted

Measure:→A,B Check specified parameters A, B. If measured values are not within specified limits the

unit under test has failed.

Observe →A,B Observe if A, B occur. If they do not occur, the unit under test has failed.

Assembly drawings have location for jumpers, test points and individual components

2.2 Safety

1. Safety Glasses are to be worn.

2. This test must be performed by qualified personnel trained in electronics theory and understand the

risks and hazards of the assembly to be tested.

3. ESD precautions must be followed while handling electronic assemblies while performing this test.

4. Precautions should be observed to avoid touching areas of the assembly that may get hot or present a

shock hazard during testing.

2.3 Quality

1. Test data shall be made available upon request by Texas Instruments.

2.4 Apparel

1. Electrostatic smock

2. Electrostatic Gloves or finger cots

3. Safety Glasses

4. Ground ESD wrist strap

800mA, Single-Input, Single Cell Li-Ion Battery Solar Charger with Power Path SLUU477–December 2010

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Texas Instruments SLUU477 User Manual Page 4